To provide high computational capabilities, and, at the same time, minimize the power consumption, modern Systems-on-Chip (SoCs) target very low energy consumption per operation as a primary objective. This goal has been achieved in recent years by adopting simple, yet very effective strategies like aggressive voltage and frequency scaling. However, the process variations that affects highly scaled technology nodes represents a severe limitation to the application of such techniques [2]; forcing digital designers to account for significant supply voltage margins to guarantee sign-off frequencies [1]. In this demo, we show how the effect of process variations can be statically mitigated on a chip fabricated in 22nm FDX technology, thanks to the application of a Body-Biasing (BB) voltage, which is capable to trim the performance of the circuit.

Live Demonstration: Exploiting Body-Biasing for Static Corner Trimming and Maximum Energy Efficiency Operation in 22nm FDX Technology / Di Mauro, Alfio; Zaruba, Florian; Schuiki, Fabian; Mach, Stefan; Benini, Luca. - ELETTRONICO. - (2020), pp. 1-1. (Intervento presentato al convegno 2020 IEEE International Symposium on Circuits and Systems (ISCAS) tenutosi a Siviglia nel 10-21 ottobre 2020) [10.1109/ISCAS45731.2020.9180961].

Live Demonstration: Exploiting Body-Biasing for Static Corner Trimming and Maximum Energy Efficiency Operation in 22nm FDX Technology

Benini, Luca
2020

Abstract

To provide high computational capabilities, and, at the same time, minimize the power consumption, modern Systems-on-Chip (SoCs) target very low energy consumption per operation as a primary objective. This goal has been achieved in recent years by adopting simple, yet very effective strategies like aggressive voltage and frequency scaling. However, the process variations that affects highly scaled technology nodes represents a severe limitation to the application of such techniques [2]; forcing digital designers to account for significant supply voltage margins to guarantee sign-off frequencies [1]. In this demo, we show how the effect of process variations can be statically mitigated on a chip fabricated in 22nm FDX technology, thanks to the application of a Body-Biasing (BB) voltage, which is capable to trim the performance of the circuit.
2020
2020 IEEE International Symposium on Circuits and Systems (ISCAS)
1
1
Live Demonstration: Exploiting Body-Biasing for Static Corner Trimming and Maximum Energy Efficiency Operation in 22nm FDX Technology / Di Mauro, Alfio; Zaruba, Florian; Schuiki, Fabian; Mach, Stefan; Benini, Luca. - ELETTRONICO. - (2020), pp. 1-1. (Intervento presentato al convegno 2020 IEEE International Symposium on Circuits and Systems (ISCAS) tenutosi a Siviglia nel 10-21 ottobre 2020) [10.1109/ISCAS45731.2020.9180961].
Di Mauro, Alfio; Zaruba, Florian; Schuiki, Fabian; Mach, Stefan; Benini, Luca
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/795310
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