Radio-frequency power transistors affected by dispersive phenomena such as thermal and charge trapping effects can be effectively characterized and modeled by means of pulsed current-voltage measurements. This work presents the design of a passive bias network made out of off-the-shelf components and tailored for the application of fast pulses through its capacitive path, yet extending the bandwidth down to a few kHz. This custom component enables small duty-cycle (e.g., 0.1 %) fast-pulsed excitations of several tens of V of ac voltage in the presence of bias voltages up to 50 V and bias currents up to 2 A.

A bias network for small duty-cycle fast-pulsed measurement of RF power transistors / Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - ELETTRONICO. - 1065:5(2018), pp. 052007.1-052007.4. (Intervento presentato al convegno 22nd World Congress of the International Measurement Confederation, IMEKO 2018 tenutosi a Belfast Waterfront Conference and Exhibition Centre, gbr nel 2018) [10.1088/1742-6596/1065/5/052007].

A bias network for small duty-cycle fast-pulsed measurement of RF power transistors

Gibiino, G. P.;Cignani, R.;Santarelli, A.;Traverso, P. A.
2018

Abstract

Radio-frequency power transistors affected by dispersive phenomena such as thermal and charge trapping effects can be effectively characterized and modeled by means of pulsed current-voltage measurements. This work presents the design of a passive bias network made out of off-the-shelf components and tailored for the application of fast pulses through its capacitive path, yet extending the bandwidth down to a few kHz. This custom component enables small duty-cycle (e.g., 0.1 %) fast-pulsed excitations of several tens of V of ac voltage in the presence of bias voltages up to 50 V and bias currents up to 2 A.
2018
Journal of Physics: Conference Series
1
4
A bias network for small duty-cycle fast-pulsed measurement of RF power transistors / Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - ELETTRONICO. - 1065:5(2018), pp. 052007.1-052007.4. (Intervento presentato al convegno 22nd World Congress of the International Measurement Confederation, IMEKO 2018 tenutosi a Belfast Waterfront Conference and Exhibition Centre, gbr nel 2018) [10.1088/1742-6596/1065/5/052007].
Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A.
File in questo prodotto:
Eventuali allegati, non sono esposti

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/657301
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? ND
social impact