This paper proposes a new model of functional units for variation-induced timing errors due to PVT variations and device Aging (PVTA). The model takes into account PVTA parameter variations, clock frequency, and the physical details of Placed-and-Routed (P&R) functional units in 45nm TSMC analysis flow. Using this model and PVTA monitoring circuits, we propose Hierarchically Focused Guardbanding (HFG) as a method to adaptively mitigate PVTA variations. We demonstrate the effectiveness of HFG on GPU architecture at two granularities of observation and adaptation: (i) fine-grained instruction-level; and (ii) coarse-grained kernel-level. Using coarse-grained PVTA monitors with kernel-level adaptation, the throughput increases by 70% on average. By comparison, the instruction-by-instruction monitoring and adaptation enhances throughput by a factor of 1.8×–2.1× depending on the configuration of PVTA monitors and the type of instructions executed in the kernels.

Hierarchically Focused Guardbanding: An Adaptive Approach to Mitigate PVT Variations and Aging

BENINI, LUCA;
2013

Abstract

This paper proposes a new model of functional units for variation-induced timing errors due to PVT variations and device Aging (PVTA). The model takes into account PVTA parameter variations, clock frequency, and the physical details of Placed-and-Routed (P&R) functional units in 45nm TSMC analysis flow. Using this model and PVTA monitoring circuits, we propose Hierarchically Focused Guardbanding (HFG) as a method to adaptively mitigate PVTA variations. We demonstrate the effectiveness of HFG on GPU architecture at two granularities of observation and adaptation: (i) fine-grained instruction-level; and (ii) coarse-grained kernel-level. Using coarse-grained PVTA monitors with kernel-level adaptation, the throughput increases by 70% on average. By comparison, the instruction-by-instruction monitoring and adaptation enhances throughput by a factor of 1.8×–2.1× depending on the configuration of PVTA monitors and the type of instructions executed in the kernels.
2013
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
1695
1700
Abbas Rahimi;Luca Benini;Rajesh K. Gupta
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/303738
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