Reversible logic design is a well-known paradigm in digital computation. While an extensive literature exists on its mathematical characterization, little work has been reported on its possible technological basis. In this paper, Quantum-dot Cellular Automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (denoted as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. As the bijective nature of reversibility makes testing significantly easier than in the general case, testing of the reversible gates is pursued in detail. C-testability of a 1D array is investigated for single cell fault as well multiple cell faults. Defect analysis of the reversible gates is pursued under a single missing/additional cell assumption.
Testing Reversible 1D Arrays of Molecular QCA / X. Ma; J. Huang; C. Metra; F. Lombardi. - STAMPA. - 1:(2006), pp. 71-79. (Intervento presentato al convegno 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems tenutosi a Washington DC, USA nel 4-6 October, 2006).
Testing Reversible 1D Arrays of Molecular QCA
METRA, CECILIA;
2006
Abstract
Reversible logic design is a well-known paradigm in digital computation. While an extensive literature exists on its mathematical characterization, little work has been reported on its possible technological basis. In this paper, Quantum-dot Cellular Automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (denoted as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. As the bijective nature of reversibility makes testing significantly easier than in the general case, testing of the reversible gates is pursued in detail. C-testability of a 1D array is investigated for single cell fault as well multiple cell faults. Defect analysis of the reversible gates is pursued under a single missing/additional cell assumption.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
