A novel family of windows are proposed for digital spectrum analysis and the main figures of merit compared to those associated with both well-known and state-of-the-art windows available in the literature. The elements of the family, which are obtained by means of successive linear convolutions between elementary rectangular windows, present a very good side-lobe behaviour if a moderately high order of convolution is considered and allow for a strong reduction of the spectral leakage effect at the output of the analysis. The growth of the main-lobe within the spectrum of the proposed windows is acceptable for most of the applications, and the benefits deriving from the rapidly fading side-lobe signature can be appreciated even in presence of the need for a quite high frequency resolution, when the large storage capabilities and computational efficiency provided by modern sampling instrumentation are properly exploited.

Cascaded rectangular windows for leakage reduction in spectral analysis

TRAVERSO, PIER ANDREA;MIRRI, DOMENICO;PASINI, GAETANO;
2004

Abstract

A novel family of windows are proposed for digital spectrum analysis and the main figures of merit compared to those associated with both well-known and state-of-the-art windows available in the literature. The elements of the family, which are obtained by means of successive linear convolutions between elementary rectangular windows, present a very good side-lobe behaviour if a moderately high order of convolution is considered and allow for a strong reduction of the spectral leakage effect at the output of the analysis. The growth of the main-lobe within the spectrum of the proposed windows is acceptable for most of the applications, and the benefits deriving from the rapidly fading side-lobe signature can be appreciated even in presence of the need for a quite high frequency resolution, when the large storage capabilities and computational efficiency provided by modern sampling instrumentation are properly exploited.
Proceedings of IMEKO TC-4 XIII International Symposium (Measurements for Research and Industry Applications)
331
336
P. A. Traverso; D. Mirri; G. Pasini; G. Iuculano
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11585/15497
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