Large-signal dynamic modelling of III-V FETs cannot be simply based on DC i/v characteristics, when accurate performance prediction is needed. In fact, dispersive phenomena due to self-heating and/or traps (surface state densities and deep level traps) must be taken into account since they cause important deviations in the low-frequency dynamic drain current. Thus, static drain current characteristics should be replaced with a suitable model which also accounts for low-frequency dispersive effects. The research community has proposed different modelling approaches and quite often a characterisation by means of pulsed i/v measurement systems has been suggested as the more appropriate for the identification of lowfrequency drain current models. In the paper, a new largesignal measurement setup is presented which is based on simple low-frequency sinusoidal excitations and it is easily reproducible with conventional general-purpose lab instrumentation. Moreover, the proposed setup is adopted in the paper to extract a backgating-like model for dispersive phenomena.
A. Raffo, A. Santarelli, P. A. Traverso, G. Vannini, F. Filicori (2004). On-Wafer I/V Measurement Setup for the Characterization of Low-Frequency Dispersion in Electron Devices. NEW YORK : IEEE Microwave Theory and Techniques Society.
On-Wafer I/V Measurement Setup for the Characterization of Low-Frequency Dispersion in Electron Devices
SANTARELLI, ALBERTO;TRAVERSO, PIER ANDREA;FILICORI, FABIO
2004
Abstract
Large-signal dynamic modelling of III-V FETs cannot be simply based on DC i/v characteristics, when accurate performance prediction is needed. In fact, dispersive phenomena due to self-heating and/or traps (surface state densities and deep level traps) must be taken into account since they cause important deviations in the low-frequency dynamic drain current. Thus, static drain current characteristics should be replaced with a suitable model which also accounts for low-frequency dispersive effects. The research community has proposed different modelling approaches and quite often a characterisation by means of pulsed i/v measurement systems has been suggested as the more appropriate for the identification of lowfrequency drain current models. In the paper, a new largesignal measurement setup is presented which is based on simple low-frequency sinusoidal excitations and it is easily reproducible with conventional general-purpose lab instrumentation. Moreover, the proposed setup is adopted in the paper to extract a backgating-like model for dispersive phenomena.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
