BELLEI, MARCO
 Distribuzione geografica
Continente #
NA - Nord America 460
AS - Asia 277
EU - Europa 260
AF - Africa 12
SA - Sud America 6
OC - Oceania 1
Totale 1.016
Nazione #
US - Stati Uniti d'America 454
CN - Cina 81
VN - Vietnam 71
SG - Singapore 70
GB - Regno Unito 63
SE - Svezia 44
DE - Germania 36
UA - Ucraina 33
IT - Italia 25
HK - Hong Kong 17
FR - Francia 13
IE - Irlanda 13
IN - India 12
RU - Federazione Russa 12
JP - Giappone 11
BE - Belgio 6
BR - Brasile 6
CA - Canada 6
KR - Corea 6
BG - Bulgaria 5
TG - Togo 5
EE - Estonia 3
SC - Seychelles 3
ZA - Sudafrica 3
CH - Svizzera 2
GE - Georgia 2
PL - Polonia 2
AT - Austria 1
AU - Australia 1
BD - Bangladesh 1
GR - Grecia 1
ID - Indonesia 1
IL - Israele 1
KE - Kenya 1
LT - Lituania 1
MY - Malesia 1
PH - Filippine 1
PK - Pakistan 1
TH - Thailandia 1
Totale 1.016
Città #
Ann Arbor 195
Singapore 49
Southend 47
Dong Ket 26
Jacksonville 24
Chandler 23
Hefei 22
Santa Clara 22
Hong Kong 17
San Jose 16
Dublin 13
Ashburn 12
Wilmington 12
Woodbridge 12
Hanoi 11
Princeton 11
Tokyo 10
Fairfield 9
Houston 9
Boardman 8
Seattle 8
Ho Chi Minh City 7
Beijing 6
Brussels 6
Seoul 6
Bremen 5
Lauterbourg 5
Lomé 5
Padova 5
Sofia 5
Turin 5
Westminster 5
Berlin 4
Buffalo 4
Cambridge 4
Medford 4
Bologna 3
Dearborn 3
Mahé 3
Mülheim 3
Nanchang 3
Nanjing 3
New York 3
Shenyang 3
Toronto 3
Bengaluru 2
Bern 2
Bình Phước 2
Hebei 2
Jinan 2
London 2
Los Angeles 2
Ludhiana 2
Milan 2
Norwalk 2
Phoenix 2
Rome 2
São Paulo 2
Tianjin 2
Verona 2
Warsaw 2
Angra dos Reis 1
Aracaju 1
Caxambu 1
Charleston 1
Charlotte 1
Clearwater 1
Da Lat 1
Da Nang 1
Falkenstein 1
Franca 1
Frankfurt Am Main 1
Guangzhou 1
Haikou 1
Hangzhou 1
Hengyang 1
Hòa Bình 1
Hải Dương 1
Jiaozuo 1
Katsushika 1
Kuala Lumpur 1
Kunming 1
Lahore 1
Lanham 1
Manchester 1
Melbourne 1
Montreal 1
Moscow 1
Ningbo 1
Paris 1
Redondo Beach 1
Saint Petersburg 1
San Francisco 1
Sarnia 1
Shanghai 1
Shenzhen 1
Shijiazhuang 1
South Gate 1
St Petersburg 1
Stockholm 1
Totale 730
Nome #
A MEMS capacitive test structure for in-line automatic planar stress characterization 243
Low-loss ohmic RF-MEMS switches with interdigitated electrode topology 216
RF-MEMS tunable networks for VCO applications 202
Capacitive Test-Structures Design Methodology for the Extraction of Air-Gap and Dielectric Thickness of a MEMS Process 190
Interdigitated Low-Loss Ohmic RF-MEMS Switches 169
Totale 1.020
Categoria #
all - tutte 2.078
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.078


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202144 0 0 0 0 0 0 0 0 0 0 9 35
2021/2022278 17 4 34 37 34 28 25 25 26 10 15 23
2022/2023126 12 24 11 15 10 8 2 7 19 2 12 4
2023/202429 1 6 0 2 4 8 2 0 0 3 0 3
2024/2025103 0 21 12 10 24 1 7 8 0 1 2 17
2025/2026208 12 31 24 16 31 25 18 0 37 9 5 0
Totale 1.020