BELLEI, MARCO
BELLEI, MARCO
DIP. DI ELETTRONICA,INFORMATICA,SISTEMISTICA-DEIS
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Risultati 1 - 5 di 5 (tempo di esecuzione: 0.007 secondi).
A MEMS capacitive test structure for in-line automatic planar stress characterization
2008 M. Bellei; R. Gaddi; A. Gnudi
Capacitive Test-Structures Design Methodology for the Extraction of Air-Gap and Dielectric Thickness of a MEMS Process
2006 M. Bellei; B. Margesin; R. Gaddi; A. Gnudi; F. Giacomozzi
RF-MEMS tunable networks for VCO applications
2005 R. Gaddi; A. Gnudi; M. Bellei; B. Margesin; F. Giacomozzi
Interdigitated Low-Loss Ohmic RF-MEMS Switches
2004 GADDI R.; BELLEI M.; GNUDI A.; MARGESIN B.; GIACOMOZZI F.
Low-loss ohmic RF-MEMS switches with interdigitated electrode topology
2004 GADDI R.; BELLEI M.; GNUDI A.; MARGESIN B.; GIACOMOZZI F.
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| A MEMS capacitive test structure for in-line automatic planar stress characterization | M. Bellei; R. Gaddi; A. Gnudi | 2008-01-01 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | - | 1.01 Articolo in rivista | - |
| Capacitive Test-Structures Design Methodology for the Extraction of Air-Gap and Dielectric Thickness of a MEMS Process | M. Bellei; B. Margesin; R. Gaddi; A. Gnudi; F. Giacomozzi | 2006-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| RF-MEMS tunable networks for VCO applications | R. Gaddi; A. Gnudi; M. Bellei; B. Margesin; F. Giacomozzi | 2005-01-01 | - | TIMA Labs | 4.01 Contributo in Atti di convegno | - |
| Interdigitated Low-Loss Ohmic RF-MEMS Switches | GADDI R.; BELLEI M.; GNUDI A.; MARGESIN B.; GIACOMOZZI F. | 2004-01-01 | - | Nano Science and Technology Institute | 4.01 Contributo in Atti di convegno | - |
| Low-loss ohmic RF-MEMS switches with interdigitated electrode topology | GADDI R.; BELLEI M.; GNUDI A.; MARGESIN B.; GIACOMOZZI F. | 2004-01-01 | - | TIMA Labs. | 4.01 Contributo in Atti di convegno | - |