PERRONI, GIANCARLO
PERRONI, GIANCARLO
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A Method for Determining the Screening Length of the Coulombic Scattering in Non-Degenerate and Degenerate Semiconductors
2004 M. Rudan; G. Perroni
Experimental investigation on the Coulomb screening length in silicon
2004 M. Rudan; G. Perroni
Gate current of a ‘well-tempered’ MOSFET simulated with the spherical-harmonic expansion model
2004 G. Perroni; S. Reggiani; M. Rudan
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| A Method for Determining the Screening Length of the Coulombic Scattering in Non-Degenerate and Degenerate Semiconductors | M. Rudan; G. Perroni | 2004-01-01 | - | Springer | 4.01 Contributo in Atti di convegno | - |
| Experimental investigation on the Coulomb screening length in silicon | M. Rudan; G. Perroni | 2004-01-01 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | - | 1.01 Articolo in rivista | - |
| Gate current of a ‘well-tempered’ MOSFET simulated with the spherical-harmonic expansion model | G. Perroni; S. Reggiani; M. Rudan | 2004-01-01 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | - | 1.01 Articolo in rivista | - |