The aim of this paper is to investigate the relationship between mechanical stress and a new conduction mechanism discovered recently, that is conduction through fast charge pulses in insulting polymers. Theories and experimental data suggested that such pulses constitute charge solitons moving in the insulation bulk thanks to the induced compressive force applied to the natural relaxation of the polymer chains. This paper supports such picture. Experimental tests carried out under mechanical stress, in fact, show that charge pulse transport is significantly affected by insulation compression. In particular, charge pulse amplitude decreases and positive pulses disappear as mechanical stress is increased. On the contrary, negative pulse mobility increases with the applied stress.
Effect of mechanical stress on fast pulse-like conduction in XLPE based materials / D. Fabiani; G.C. Montanari; L.A. Dissado. - STAMPA. - 2:(2010), pp. 357-360. (Intervento presentato al convegno IEEE Int. Conf. on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP) tenutosi a West Lafayette, USA nel 17-20 Ottobre 2010) [10.1109/CEIDP.2010.5723989].
Effect of mechanical stress on fast pulse-like conduction in XLPE based materials
FABIANI, DAVIDE;MONTANARI, GIAN CARLO;
2010
Abstract
The aim of this paper is to investigate the relationship between mechanical stress and a new conduction mechanism discovered recently, that is conduction through fast charge pulses in insulting polymers. Theories and experimental data suggested that such pulses constitute charge solitons moving in the insulation bulk thanks to the induced compressive force applied to the natural relaxation of the polymer chains. This paper supports such picture. Experimental tests carried out under mechanical stress, in fact, show that charge pulse transport is significantly affected by insulation compression. In particular, charge pulse amplitude decreases and positive pulses disappear as mechanical stress is increased. On the contrary, negative pulse mobility increases with the applied stress.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.