In this paper the effect on dc and ac electrical properties of silica nano and micro particles dispersed in epoxy resins is discussed. In particular, space charge, conductivity, dielectric strength and partial discharge resistance is analyzed. The results show that nanostructured materials exhibit smaller space charge accumulation with respect to both base and microfilled materials. Regarding PD resistance, micro + nano filled materials display longer lifetimes with respect to base epoxy resin and materials including nanofillers or microfillers alone.

Epoxy based materials containing micro and nano sized fillers for improbe electrical characteristics / D. Fabiani; G. C. Montanari; A. Krivda; L.E. Schmidt; R. Hollertz. - STAMPA. - (2010), pp. 212-215. (Intervento presentato al convegno IEEE Int. Conf. on Solid Dielectrics (IEEE ICSD) tenutosi a Potsdam, Germany nel 4-9 luglio 2010).

Epoxy based materials containing micro and nano sized fillers for improbe electrical characteristics

FABIANI, DAVIDE;MONTANARI, GIAN CARLO;
2010

Abstract

In this paper the effect on dc and ac electrical properties of silica nano and micro particles dispersed in epoxy resins is discussed. In particular, space charge, conductivity, dielectric strength and partial discharge resistance is analyzed. The results show that nanostructured materials exhibit smaller space charge accumulation with respect to both base and microfilled materials. Regarding PD resistance, micro + nano filled materials display longer lifetimes with respect to base epoxy resin and materials including nanofillers or microfillers alone.
2010
Proceedings of the 2010 IEEE Int. Conf. on Solid Dielectrics
212
215
Epoxy based materials containing micro and nano sized fillers for improbe electrical characteristics / D. Fabiani; G. C. Montanari; A. Krivda; L.E. Schmidt; R. Hollertz. - STAMPA. - (2010), pp. 212-215. (Intervento presentato al convegno IEEE Int. Conf. on Solid Dielectrics (IEEE ICSD) tenutosi a Potsdam, Germany nel 4-9 luglio 2010).
D. Fabiani; G. C. Montanari; A. Krivda; L.E. Schmidt; R. Hollertz
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/99570
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