This paper investigates a new monitoring and diagnostic technique for the detection of rotor electrical faults in Doubly Fed Induction Machine (DFIM) for wind power systems under time-varying conditions. A new approach based on Frequency Sliding (FS) and Discrete Wavelet Transform (DWT) is here proposed in order to detect rotor faults dynamically over time. Moreover the mean power at different resolution levels was introduced as a dynamic fault indicator to quantify the fault extent. Simulations and experimental results show the effectiveness of this new method in discriminating healthy from faulty rotor in time-varying operating conditions.

Advanced Rotor Fault Diagnosis for DFIM Based on Frequency Sliding and Wavelet Analysis under Time-Varying Conditions / Y. Gritli; A. Stefani; C. Rossi; F. Filippetti; A. Chatti. - ELETTRONICO. - 1:(2010), pp. 2607-2614. (Intervento presentato al convegno IEEE International Symposium on Industrial Electronics ISIE 2010 tenutosi a Bari Italy nel 4-7 July 2010) [10.1109/ISIE.2010.5637995].

Advanced Rotor Fault Diagnosis for DFIM Based on Frequency Sliding and Wavelet Analysis under Time-Varying Conditions

Y. Gritli;STEFANI, ANDREA;ROSSI, CLAUDIO;FILIPPETTI, FIORENZO;
2010

Abstract

This paper investigates a new monitoring and diagnostic technique for the detection of rotor electrical faults in Doubly Fed Induction Machine (DFIM) for wind power systems under time-varying conditions. A new approach based on Frequency Sliding (FS) and Discrete Wavelet Transform (DWT) is here proposed in order to detect rotor faults dynamically over time. Moreover the mean power at different resolution levels was introduced as a dynamic fault indicator to quantify the fault extent. Simulations and experimental results show the effectiveness of this new method in discriminating healthy from faulty rotor in time-varying operating conditions.
2010
IEEE International Symposium on Industrial Electronics
2607
2614
Advanced Rotor Fault Diagnosis for DFIM Based on Frequency Sliding and Wavelet Analysis under Time-Varying Conditions / Y. Gritli; A. Stefani; C. Rossi; F. Filippetti; A. Chatti. - ELETTRONICO. - 1:(2010), pp. 2607-2614. (Intervento presentato al convegno IEEE International Symposium on Industrial Electronics ISIE 2010 tenutosi a Bari Italy nel 4-7 July 2010) [10.1109/ISIE.2010.5637995].
Y. Gritli; A. Stefani; C. Rossi; F. Filippetti; A. Chatti
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/98492
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