Nowadays, as the cyber-threat landscape is evolving and digital assets are proliferating and becoming more and more interconnected with the internet and heterogeneous devices, it is fundamental to be able to obtain a sensible measure of the security of devices, networks, and systems. Industrial cyber–physical systems (ICPSs), in particular, can be exposed to high operational risks that entail damage to revenues, assets, and even people. A way to overcome the open question of measuring security is with the use of security metrics. With metrics it is possible to rely on proven indicators that benchmark systems, identify vulnerabilities, and show practical data to assess the risk. However, security metrics are often proposed with specific contexts in mind, and a set of them specifically crafted for ICPSs is not explicitly available in the literature. For this reason, in this work, we analyze the current state of the art in the selection of security metrics and we propose a systematic methodology to gather, filter, and validate security metrics. Then, we apply the procedure to the ICPS domain, gathering almost 300 metrics from the literature, analyzing the domain to identify the properties useful to filter the metrics, and applying a validation framework to assess the validity of the filtered metrics, obtaining a final set capable of measuring the security of ICPSs from different perspectives.

A Systematic Analysis of Security Metrics for Industrial Cyber–Physical Systems / Gori, Giacomo; Rinieri, Lorenzo; Melis, Andrea; Al Sadi, Amir; Callegati, Franco; Prandini, Marco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 13:7(2024), pp. 1208.1-1208.17. [10.3390/electronics13071208]

A Systematic Analysis of Security Metrics for Industrial Cyber–Physical Systems

Gori, Giacomo;Rinieri, Lorenzo;Melis, Andrea;Al Sadi, Amir;Callegati, Franco;Prandini, Marco
2024

Abstract

Nowadays, as the cyber-threat landscape is evolving and digital assets are proliferating and becoming more and more interconnected with the internet and heterogeneous devices, it is fundamental to be able to obtain a sensible measure of the security of devices, networks, and systems. Industrial cyber–physical systems (ICPSs), in particular, can be exposed to high operational risks that entail damage to revenues, assets, and even people. A way to overcome the open question of measuring security is with the use of security metrics. With metrics it is possible to rely on proven indicators that benchmark systems, identify vulnerabilities, and show practical data to assess the risk. However, security metrics are often proposed with specific contexts in mind, and a set of them specifically crafted for ICPSs is not explicitly available in the literature. For this reason, in this work, we analyze the current state of the art in the selection of security metrics and we propose a systematic methodology to gather, filter, and validate security metrics. Then, we apply the procedure to the ICPS domain, gathering almost 300 metrics from the literature, analyzing the domain to identify the properties useful to filter the metrics, and applying a validation framework to assess the validity of the filtered metrics, obtaining a final set capable of measuring the security of ICPSs from different perspectives.
2024
A Systematic Analysis of Security Metrics for Industrial Cyber–Physical Systems / Gori, Giacomo; Rinieri, Lorenzo; Melis, Andrea; Al Sadi, Amir; Callegati, Franco; Prandini, Marco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 13:7(2024), pp. 1208.1-1208.17. [10.3390/electronics13071208]
Gori, Giacomo; Rinieri, Lorenzo; Melis, Andrea; Al Sadi, Amir; Callegati, Franco; Prandini, Marco
File in questo prodotto:
Eventuali allegati, non sono esposti

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/966816
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact