We investigate the real-space profile of effective Coulomb interactions in correlated kagome materials. By particularizing to KV3Sb5, Co3Sn2S2, FeSn, and Ni3In, we analyze representative cases that exhibit a large span of correlation-mediated phenomena, and contrast them to prototypical perovskite transition metal oxides. From our constrained random phase approximation studies we find that the on-site interaction strength in kagome metals not only depends on the screening processes at high energy, but also on the low-energy hybridization profile of the electronic density of states. Our results indicate that rescaled by the on-site interaction amplitude, all kagome metals exhibit a universal long-range Coulomb behavior.

Electronic correlations and universal long-range scaling in kagome metals / Di Sante, Domenico; Kim, Bongjae; Hanke, Werner; Wehling, Tim; Franchini, Cesare; Thomale, Ronny; Sangiovanni, Giorgio. - In: PHYSICAL REVIEW RESEARCH. - ISSN 2643-1564. - ELETTRONICO. - 5:1(2023), pp. 012008-012008. [10.1103/physrevresearch.5.l012008]

Electronic correlations and universal long-range scaling in kagome metals

Di Sante, Domenico;Franchini, Cesare;
2023

Abstract

We investigate the real-space profile of effective Coulomb interactions in correlated kagome materials. By particularizing to KV3Sb5, Co3Sn2S2, FeSn, and Ni3In, we analyze representative cases that exhibit a large span of correlation-mediated phenomena, and contrast them to prototypical perovskite transition metal oxides. From our constrained random phase approximation studies we find that the on-site interaction strength in kagome metals not only depends on the screening processes at high energy, but also on the low-energy hybridization profile of the electronic density of states. Our results indicate that rescaled by the on-site interaction amplitude, all kagome metals exhibit a universal long-range Coulomb behavior.
2023
Electronic correlations and universal long-range scaling in kagome metals / Di Sante, Domenico; Kim, Bongjae; Hanke, Werner; Wehling, Tim; Franchini, Cesare; Thomale, Ronny; Sangiovanni, Giorgio. - In: PHYSICAL REVIEW RESEARCH. - ISSN 2643-1564. - ELETTRONICO. - 5:1(2023), pp. 012008-012008. [10.1103/physrevresearch.5.l012008]
Di Sante, Domenico; Kim, Bongjae; Hanke, Werner; Wehling, Tim; Franchini, Cesare; Thomale, Ronny; Sangiovanni, Giorgio
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/962414
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