Traditional methods for characterizing piezoelectric materials typically involve analyzing their electromechanical response, focusing on coefficients such as the piezoelectric strain coefficient d33. In this study, an alternative approach is proposed to evaluate the piezoelectric response by examining the surface charge accumulated in the tested sample following a corona polarization process. Through the use of an electrostatic voltmeter, two influential factors affecting the piezoelectric response were investigated: the number of needles employed during the polarization and the presence of a grid interposed between the high-voltage needles and the specimen.

Optimization of Corona Triode Polarization by 2D Electrostatic Mapping / L Gasperini, A Rumi, G Selleri, D Fabiani, P Seri. - ELETTRONICO. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) tenutosi a East Rutherford, NJ (USA) nel October 2023) [10.1109/CEIDP51414.2023.10410529].

Optimization of Corona Triode Polarization by 2D Electrostatic Mapping

L Gasperini
;
A Rumi;G Selleri;D Fabiani;P Seri
2023

Abstract

Traditional methods for characterizing piezoelectric materials typically involve analyzing their electromechanical response, focusing on coefficients such as the piezoelectric strain coefficient d33. In this study, an alternative approach is proposed to evaluate the piezoelectric response by examining the surface charge accumulated in the tested sample following a corona polarization process. Through the use of an electrostatic voltmeter, two influential factors affecting the piezoelectric response were investigated: the number of needles employed during the polarization and the presence of a grid interposed between the high-voltage needles and the specimen.
2023
Proceeedings of 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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Optimization of Corona Triode Polarization by 2D Electrostatic Mapping / L Gasperini, A Rumi, G Selleri, D Fabiani, P Seri. - ELETTRONICO. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) tenutosi a East Rutherford, NJ (USA) nel October 2023) [10.1109/CEIDP51414.2023.10410529].
L Gasperini, A Rumi, G Selleri, D Fabiani, P Seri
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/957482
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