Probing molecular arrangements of the organic semiconductor 2,7-Dioctyl[1]benzothieno[3,2- b][1]benzothiophene thin film at the interface by UV Resonant Raman scattering

Raman spectroscopy was employed to investigate nanometric thick films of the organic semiconductor 2,7-Dioctyl[1]benzothieno[3,2-b][1]benzothiophene, following a comprehensive vibrational characterization of the compound condensed phases at various excitation wavelengths. UV Raman excitation enabled the characterization of the thin films, revealing that the molecular orientation at the film/air interface is characterized by a different organization and/or a high degree of disorder compared to the bulk phase. The low penetration depth of the UV Raman excitation allows for the retrieval of this information, unlike the XRD data.