This study aims at estimating for the first time the life in HVDC Mass-Impregnated Non-Draining MIND cables subjected to Prequalification Test (PQT) conditions according to CIGRÉ Technical Brochure 853-2021. A MATLAB simulation is carried out to calculate temperature and electric field distribution within MIND insulation during PQT Load Cycles, and to estimate cable insulation life under PQT conditions. The results show that estimated life of MIND cables under PQT conditions is far longer than the duration of the PQT (360 days), as well as longer than that previously estimated under the same conditions for extruded cables.

Life estimation of MIND HVDC cables subjected to qualification tests conditions / B. Diban, G. Mazzanti. - ELETTRONICO. - (2023), pp. 339-342. (Intervento presentato al convegno IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2023) tenutosi a East Rutherford, New Jersey, USA nel 14-19 Ottobre 2023) [10.1109/CEIDP51414.2023.10410541].

Life estimation of MIND HVDC cables subjected to qualification tests conditions

B. Diban;G. Mazzanti
2023

Abstract

This study aims at estimating for the first time the life in HVDC Mass-Impregnated Non-Draining MIND cables subjected to Prequalification Test (PQT) conditions according to CIGRÉ Technical Brochure 853-2021. A MATLAB simulation is carried out to calculate temperature and electric field distribution within MIND insulation during PQT Load Cycles, and to estimate cable insulation life under PQT conditions. The results show that estimated life of MIND cables under PQT conditions is far longer than the duration of the PQT (360 days), as well as longer than that previously estimated under the same conditions for extruded cables.
2023
Proceedings of 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2023)
339
342
Life estimation of MIND HVDC cables subjected to qualification tests conditions / B. Diban, G. Mazzanti. - ELETTRONICO. - (2023), pp. 339-342. (Intervento presentato al convegno IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2023) tenutosi a East Rutherford, New Jersey, USA nel 14-19 Ottobre 2023) [10.1109/CEIDP51414.2023.10410541].
B. Diban, G. Mazzanti
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/955132
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