In this paper, evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
Understanding the direct detection of charged particles with SiPMs / Carnesecchi F.; Vignola G.; Agrawal N.; Alici A.; Antonioli P.; Arcelli S.; Bellini F.; Cavazza D.; Cifarelli L.; Colocci M.; Durando S.; Ercolessi F.; Ficorella A.; Fraticelli C.; Garbini M.; Giacalone M.; Gola A.; Hatzifotiadou D.; Jacazio N.; Margotti A.; Malfattore G.; Nania R.; Noferini F.; Paternoster G.; Pinazza O.; Preghenella R.; Rath R.; Ricci R.; Rignanese L.; Rubini N.; Sabiu B.; Scapparone E.; Scioli G.; Strazzi S.; Tripathy S.; Zichichi A.. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - STAMPA. - 138:4(2023), pp. 337.1-337.4. [10.1140/epjp/s13360-023-03923-4]
Understanding the direct detection of charged particles with SiPMs
Carnesecchi F.
;Agrawal N.;Alici A.;Arcelli S.;Bellini F.;Cifarelli L.;Colocci M.;Ercolessi F.;Giacalone M.;Jacazio N.;Malfattore G.;Rubini N.;Sabiu B.;Scioli G.;Strazzi S.;
2023
Abstract
In this paper, evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
