Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision.

A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction / Awais Ch M, Gu W, Dlamini G, Kholmatova Z, Succi G. - ELETTRONICO. - 716:(2023), pp. 139-149. (Intervento presentato al convegno International Conference on Intelligent Systems Design and Applications (ISDA 2022) tenutosi a Online Streaming nel December 12-14) [10.1007/978-3-031-35501-1_14].

A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction.

Succi G
2023

Abstract

Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision.
2023
Intelligent Systems Design and Applications. ISDA 2022
139
149
A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction / Awais Ch M, Gu W, Dlamini G, Kholmatova Z, Succi G. - ELETTRONICO. - 716:(2023), pp. 139-149. (Intervento presentato al convegno International Conference on Intelligent Systems Design and Applications (ISDA 2022) tenutosi a Online Streaming nel December 12-14) [10.1007/978-3-031-35501-1_14].
Awais Ch M, Gu W, Dlamini G, Kholmatova Z, Succi G
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/933397
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