Characterization of traps in dielectrics is very important to properly describe their space charge behavior. An alternative technique to standard Isothermal Surface Potential Decay measurements is proposed in this paper. The proposed method allows for estimation of potentials both during the polarization phase and immediately after depolarization of surfaces, monitoring of fast surface potential transients as well as slower ones. Results from both evaluations and space charge depolarization measurements on samples of DER332 epoxy resin are in good agreement with each other, showing that there are two predominant traps at energies of 0.81 eV and 0.92 eV respectively and validating the proposed innovative procedure.

Mariani D., Suraci S.V., Fabiani D., Seri P. (2022). Method for fast isothermal surface potential decay measurements. Institute of Electrical and Electronics Engineers Inc. [10.1109/CEIDP55452.2022.9985371].

Method for fast isothermal surface potential decay measurements

Mariani D.
Data Curation
;
Suraci S. V.
Supervision
;
Fabiani D.
Validation
;
Seri P.
Writing – Original Draft Preparation
2022

Abstract

Characterization of traps in dielectrics is very important to properly describe their space charge behavior. An alternative technique to standard Isothermal Surface Potential Decay measurements is proposed in this paper. The proposed method allows for estimation of potentials both during the polarization phase and immediately after depolarization of surfaces, monitoring of fast surface potential transients as well as slower ones. Results from both evaluations and space charge depolarization measurements on samples of DER332 epoxy resin are in good agreement with each other, showing that there are two predominant traps at energies of 0.81 eV and 0.92 eV respectively and validating the proposed innovative procedure.
2022
Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
224
227
Mariani D., Suraci S.V., Fabiani D., Seri P. (2022). Method for fast isothermal surface potential decay measurements. Institute of Electrical and Electronics Engineers Inc. [10.1109/CEIDP55452.2022.9985371].
Mariani D.; Suraci S.V.; Fabiani D.; Seri P.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/916839
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