Atomic force microscopy (AFM) can be a powerful tool to quantitatively describe the fracture process in zirconia. In the study of ceramic materials, AFM is used to produce nanometric-scale information on the indentation fracture and toughening mechanisms acting in zirconia polycrystals samples.
AFM, a tool for investigating indentation damage in ZrO2 / Celli A.; Gutema T.; Bracali P.; Groppetti R.; Esposito L.; Ricci A.. - In: AMERICAN CERAMIC SOCIETY BULLETIN. - ISSN 0002-7812. - STAMPA. - 78:8(1999), pp. 87-91.
AFM, a tool for investigating indentation damage in ZrO2
Celli A.;Esposito L.;
1999
Abstract
Atomic force microscopy (AFM) can be a powerful tool to quantitatively describe the fracture process in zirconia. In the study of ceramic materials, AFM is used to produce nanometric-scale information on the indentation fracture and toughening mechanisms acting in zirconia polycrystals samples.File in questo prodotto:
Eventuali allegati, non sono esposti
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.