Atomic force microscopy (AFM) can be a powerful tool to quantitatively describe the fracture process in zirconia. In the study of ceramic materials, AFM is used to produce nanometric-scale information on the indentation fracture and toughening mechanisms acting in zirconia polycrystals samples.
Celli A., Gutema T., Bracali P., Groppetti R., Esposito L., Ricci A. (1999). AFM, a tool for investigating indentation damage in ZrO2. AMERICAN CERAMIC SOCIETY BULLETIN, 78(8), 87-91.
AFM, a tool for investigating indentation damage in ZrO2
Celli A.;Esposito L.;
1999
Abstract
Atomic force microscopy (AFM) can be a powerful tool to quantitatively describe the fracture process in zirconia. In the study of ceramic materials, AFM is used to produce nanometric-scale information on the indentation fracture and toughening mechanisms acting in zirconia polycrystals samples.File in questo prodotto:
Eventuali allegati, non sono esposti
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
