Vanadium pentoxide materials prepared through sol-gel processes act as excellent intercalation hosts for lithium as well as for polyvalent cations. Previous ex situ X-ray absorption spectroscopy and X-ray diffraction characterizations have shown that the electrochemical performance of vanadium pentoxide xerogels depends inversely on the long-range order of the V2O5-layered structure. Recently, new ways to prevent the self-organization of the dry materials, which takes place upon water removal from the starting hydrogel, have been introduced. In the present paper we report on the in situ X-ray absorption spectroscopy characterization of a spray-coated V2O5 (freeze-dried) xerogel cathode upon lithium intercalation.

In situ X-ray absorption spectroscopy characterization of V2O5 xerogel cathodes upon lithium intercalation / Giorgetti M.; Passerini S.; Smyrl W.H.; Mukerjee S.; Yang X.Q.; McBreen J.. - In: JOURNAL OF THE ELECTROCHEMICAL SOCIETY. - ISSN 0013-4651. - STAMPA. - 146:7(1999), pp. 2387-2392. [10.1149/1.1391946]

In situ X-ray absorption spectroscopy characterization of V2O5 xerogel cathodes upon lithium intercalation

Giorgetti M.;
1999

Abstract

Vanadium pentoxide materials prepared through sol-gel processes act as excellent intercalation hosts for lithium as well as for polyvalent cations. Previous ex situ X-ray absorption spectroscopy and X-ray diffraction characterizations have shown that the electrochemical performance of vanadium pentoxide xerogels depends inversely on the long-range order of the V2O5-layered structure. Recently, new ways to prevent the self-organization of the dry materials, which takes place upon water removal from the starting hydrogel, have been introduced. In the present paper we report on the in situ X-ray absorption spectroscopy characterization of a spray-coated V2O5 (freeze-dried) xerogel cathode upon lithium intercalation.
1999
In situ X-ray absorption spectroscopy characterization of V2O5 xerogel cathodes upon lithium intercalation / Giorgetti M.; Passerini S.; Smyrl W.H.; Mukerjee S.; Yang X.Q.; McBreen J.. - In: JOURNAL OF THE ELECTROCHEMICAL SOCIETY. - ISSN 0013-4651. - STAMPA. - 146:7(1999), pp. 2387-2392. [10.1149/1.1391946]
Giorgetti M.; Passerini S.; Smyrl W.H.; Mukerjee S.; Yang X.Q.; McBreen J.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/901737
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