Measurements of X-ray fluorescent intensities produced in a sample of unknown composition under different irradiation conditions, allow us to write a nonlinear set of equations on the elemental concentrations of the constituents. The equations being mutually independent assures the local uniqueness of the solution. This work introduces a method of analysis where the fluorescent intensities are produced by successively modifying the spectral content of the incident beam by interposing appopriate foils of some pure metals. The method has been extensively tested by resourse to computer simulation and verified experimentally on a special purpose spectrometer with standard reference samples of certified composition. © 1987.
Fernandez J.E., Mainardi R.T. (1987). X-ray fluorescence analysis procedure by successive attenuation of the excitation beam. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 255(1-2), 397-402 [10.1016/0168-9002(87)91136-3].
X-ray fluorescence analysis procedure by successive attenuation of the excitation beam
Fernandez J. E.
Primo
Writing – Original Draft Preparation
;
1987
Abstract
Measurements of X-ray fluorescent intensities produced in a sample of unknown composition under different irradiation conditions, allow us to write a nonlinear set of equations on the elemental concentrations of the constituents. The equations being mutually independent assures the local uniqueness of the solution. This work introduces a method of analysis where the fluorescent intensities are produced by successively modifying the spectral content of the incident beam by interposing appopriate foils of some pure metals. The method has been extensively tested by resourse to computer simulation and verified experimentally on a special purpose spectrometer with standard reference samples of certified composition. © 1987.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
