The understanding of charge carrier dynamics in complex heterojunctions is of the utmost importance for the performance optimization of photoelectrochemical cells, especially in operando. Intensity-modulated photocurrent spectroscopy (IMPS) is a powerful tool to this aim, but the information content provided by this technique can be further enhanced by selectively probing each layer of complex heterojunctions by means of multiple excitation sources. Herein, the charge carrier dynamics of a WO3/BiVO4/CoFe–PB heterojunction, used in a conventional three electrode cell for water splitting, is studied using wavelength-dependent IMPS (WD-IMPS). The proposed data analysis allows us to identify the occurrence of interface recombination processes affecting the semiconductor junction, as well as the positive contribution of the inorganic complex catalyst on the charge separation efficiency of the BiVO4 layer. The deep understanding of the fate of charge carriers in the studied photoanode validates WD-IMPS as a straightforward method to widen the understanding of such structures.

Charge Separation Efficiency in WO3/BiVO4 Photoanodes with CoFe Prussian Blue Catalyst Studied by Wavelength-Dependent Intensity-Modulated Photocurrent Spectroscopy

Vecchi, Pierpaolo
Co-primo
Investigation
;
Piccioni, Alberto
Co-primo
Investigation
;
Mazzaro, Raffaello
Investigation
;
Pasquini, Luca
Ultimo
Supervision
2022

Abstract

The understanding of charge carrier dynamics in complex heterojunctions is of the utmost importance for the performance optimization of photoelectrochemical cells, especially in operando. Intensity-modulated photocurrent spectroscopy (IMPS) is a powerful tool to this aim, but the information content provided by this technique can be further enhanced by selectively probing each layer of complex heterojunctions by means of multiple excitation sources. Herein, the charge carrier dynamics of a WO3/BiVO4/CoFe–PB heterojunction, used in a conventional three electrode cell for water splitting, is studied using wavelength-dependent IMPS (WD-IMPS). The proposed data analysis allows us to identify the occurrence of interface recombination processes affecting the semiconductor junction, as well as the positive contribution of the inorganic complex catalyst on the charge separation efficiency of the BiVO4 layer. The deep understanding of the fate of charge carriers in the studied photoanode validates WD-IMPS as a straightforward method to widen the understanding of such structures.
Vecchi, Pierpaolo; Piccioni, Alberto; Mazzaro, Raffaello; Mazzanti, Michele; Cristino, Vito; Caramori, Stefano; Pasquini, Luca
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/899530
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