The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis a of suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.
Toward a BITE for Real Time MTTF Estimation of Capacitors / A. Albertini; M.G. Masi; G. Mazzanti; L. Peretto; R. Tinarelli. - STAMPA. - (2010), pp. 437-442. (Intervento presentato al convegno 2010 International Instrumentation & Measurement Technology Conference tenutosi a Austin, Texas, USA nel 4-6 maggio 2010) [10.1109/IMTC.2010.5488065].
Toward a BITE for Real Time MTTF Estimation of Capacitors
ALBERTINI, ANDREA;MASI, MARIA GABRIELLA;MAZZANTI, GIOVANNI;PERETTO, LORENZO;TINARELLI, ROBERTO
2010
Abstract
The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis a of suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
