The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis a of suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.
A. Albertini, M.G. Masi, G. Mazzanti, L. Peretto, R. Tinarelli (2010). Toward a BITE for Real Time MTTF Estimation of Capacitors. s.l : s.m. [10.1109/IMTC.2010.5488065].
Toward a BITE for Real Time MTTF Estimation of Capacitors
ALBERTINI, ANDREA;MASI, MARIA GABRIELLA;MAZZANTI, GIOVANNI;PERETTO, LORENZO;TINARELLI, ROBERTO
2010
Abstract
The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis a of suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
