Weibull Statistics in Short-term Dielectric Breakdown of Thin Polyethylene Films

IN paper [l], the authors show that the two-parameter Weibull distribution is satisfactory to represent the results on samples of HV thermally aged EPR cables. This does not exclude, as well as they indicate it, that the three-parameter Weibull distribution is sometimes justified, especially in the case of results of short term dielectric breakdown tests [2]. The quality of test data available and the efficiency of usable methods [1,2], result partly from the international standardization [3,4] and recent statistical work [5,6]. The difficult problem remains of the choice for the statistical distribution of dielectric test results. It concerns a general enough problem that does not possess a unique solution and must take into account simultaneous physical and statistical considerations.