This paper presents the results of tests performed on small-size capacitors with the aim of investigating the effect of nonsinusoidal voltage on life performance. Harmonic components, as those detectable in ac networks supplying distorting loads, are added to the sinusoidal supply voltage and life tests are carried out under such waveforms. The effects of voltage and current distortion on accelerated electrical aging are modeled and discussed on the basis of statistical techniques, focusing mainly on the features which affect life performance of capacitors. This approach leads to a relationship between expected life and voltage waveform characteristics.

Investigation of the endurance of capacitors supplied by nonsinusoidal voltage / Ghinello I.; Mazzanti G.; Montanari G.C.; Fabiani D.; Cavallini A.. - STAMPA. - 2:(1998), pp. 723-727. (Intervento presentato al convegno 1998 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP) tenutosi a Atlanta, Georgia (U.S.A.) nel ottobre 1998).

Investigation of the endurance of capacitors supplied by nonsinusoidal voltage

Ghinello I.;Mazzanti G.;Montanari G. C.;Fabiani D.;Cavallini A.
1998

Abstract

This paper presents the results of tests performed on small-size capacitors with the aim of investigating the effect of nonsinusoidal voltage on life performance. Harmonic components, as those detectable in ac networks supplying distorting loads, are added to the sinusoidal supply voltage and life tests are carried out under such waveforms. The effects of voltage and current distortion on accelerated electrical aging are modeled and discussed on the basis of statistical techniques, focusing mainly on the features which affect life performance of capacitors. This approach leads to a relationship between expected life and voltage waveform characteristics.
1998
Proceedings of 1998 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP)
723
727
Investigation of the endurance of capacitors supplied by nonsinusoidal voltage / Ghinello I.; Mazzanti G.; Montanari G.C.; Fabiani D.; Cavallini A.. - STAMPA. - 2:(1998), pp. 723-727. (Intervento presentato al convegno 1998 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP) tenutosi a Atlanta, Georgia (U.S.A.) nel ottobre 1998).
Ghinello I.; Mazzanti G.; Montanari G.C.; Fabiani D.; Cavallini A.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/886369
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