In this paper, unbiasing procedures for the maximum likelihood method applied to the two-parameter Weibull function are dealt with. The performance of unbiasing methods applied to expected values and point estimates of the Weibull parameters, as well as the way to use the Monte Carlo method for the estimation of the expected values, are discussed. It is shown that the accuracy of the unbiasing methods can be significantly affected by several factors, such as the value of the shape parameter and the estimation of the expected value, and that some methods can be successfully applied to the point estimates of the Weibull parameters.

Unbiasing procedures for the Weibull distribution? Be careful! / Montanari G.C.; Mazzanti G.; Cacciari M.; Fothergill J.C.. - STAMPA. - (1995), pp. 175-179. (Intervento presentato al convegno 5th IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (IEEE ICSD) tenutosi a Leicester (Regno Unito) nel 10-13 luglio 1995).

Unbiasing procedures for the Weibull distribution? Be careful!

Montanari G. C.;Mazzanti G.;
1995

Abstract

In this paper, unbiasing procedures for the maximum likelihood method applied to the two-parameter Weibull function are dealt with. The performance of unbiasing methods applied to expected values and point estimates of the Weibull parameters, as well as the way to use the Monte Carlo method for the estimation of the expected values, are discussed. It is shown that the accuracy of the unbiasing methods can be significantly affected by several factors, such as the value of the shape parameter and the estimation of the expected value, and that some methods can be successfully applied to the point estimates of the Weibull parameters.
1995
Proceedings of 5th IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (IEEE ICSD)
175
179
Unbiasing procedures for the Weibull distribution? Be careful! / Montanari G.C.; Mazzanti G.; Cacciari M.; Fothergill J.C.. - STAMPA. - (1995), pp. 175-179. (Intervento presentato al convegno 5th IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (IEEE ICSD) tenutosi a Leicester (Regno Unito) nel 10-13 luglio 1995).
Montanari G.C.; Mazzanti G.; Cacciari M.; Fothergill J.C.
File in questo prodotto:
Eventuali allegati, non sono esposti

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/886345
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 4
  • ???jsp.display-item.citation.isi??? 1
social impact