The intent of this paper is to cross-correlate the information obtained by space charge profile analysis and electroluminescence (EL) detection in crass-linked polyethylene samples submitted to de fields, with the objective to make a link between space charge phenomena and energy release as revealed by detection of visible photons. Space charge measurements carried out at different electrical fields by the pulsed electro-acoustic method show the presence of a low-field threshold, close to 15 to 20 kV/mm, above which space charge begins to accumulate considerably in the insulation. Charges are seen to cross the insulation thickness through a packet-like behavior at higher fields, starting at about 60 to 70 kV/mm. EL measurements show the existence of two distinct thresholds, one related to the permanent excitation of EL under voltage, the other being transient EL detected upon specimen short-circuit. The former occurs at values of field corresponding to space charge packet formation, and the latter to the on-set of space charge accumulation. The two techniques give therefore consistent information on space charge phenomena and associated energy release in the optical EM spectrum.

Space charge and associated electroluminescence processes in XLPE cable peelings

Mazzanti, G;Montanari, GC;Dissado, LA;
2000

Abstract

The intent of this paper is to cross-correlate the information obtained by space charge profile analysis and electroluminescence (EL) detection in crass-linked polyethylene samples submitted to de fields, with the objective to make a link between space charge phenomena and energy release as revealed by detection of visible photons. Space charge measurements carried out at different electrical fields by the pulsed electro-acoustic method show the presence of a low-field threshold, close to 15 to 20 kV/mm, above which space charge begins to accumulate considerably in the insulation. Charges are seen to cross the insulation thickness through a packet-like behavior at higher fields, starting at about 60 to 70 kV/mm. EL measurements show the existence of two distinct thresholds, one related to the permanent excitation of EL under voltage, the other being transient EL detected upon specimen short-circuit. The former occurs at values of field corresponding to space charge packet formation, and the latter to the on-set of space charge accumulation. The two techniques give therefore consistent information on space charge phenomena and associated energy release in the optical EM spectrum.
2000
Proceedings of 2000 IEEE Conference on Electrical Insulation and Dielectric Phenomena (2000 IEEE CEIDP)
568
572
Laurent, C; Teyssedre, G; Auge, JL; Mazzanti, G; Montanari, GC; Dissado, LA; Fothergill, JC; See, A
File in questo prodotto:
Eventuali allegati, non sono esposti

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/886334
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 20
  • ???jsp.display-item.citation.isi??? 8
social impact