The synergism between stresses affects significantly insulating materials or systems subjected to multi-stress conditions, resulting in a reduction of life which can be particularly remarkable when stresses have comparable effects. A factor is defined here, able to quantify the synergism; in the case of two stresses, this factor has a maximum for large values of both stresses and tends to unity (the minimum value corresponding to absence of synergism) when one stress prevails. This behavior has been supported by calculations performed for PolyPropylene capacitors and EPR insulated cable models.

Study of the synergistic effect of electrical and thermal stresses on insulation life / Mazzanti G.; Montanari G.C.; Simoni L.. - STAMPA. - 2:(1996), pp. 684-687. (Intervento presentato al convegno 1996 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP) tenutosi a San Francisco, California (U.S.A.) nel 20-23 ottobre 1996).

Study of the synergistic effect of electrical and thermal stresses on insulation life

Mazzanti G.;Montanari G. C.;Simoni L.
1996

Abstract

The synergism between stresses affects significantly insulating materials or systems subjected to multi-stress conditions, resulting in a reduction of life which can be particularly remarkable when stresses have comparable effects. A factor is defined here, able to quantify the synergism; in the case of two stresses, this factor has a maximum for large values of both stresses and tends to unity (the minimum value corresponding to absence of synergism) when one stress prevails. This behavior has been supported by calculations performed for PolyPropylene capacitors and EPR insulated cable models.
1996
Proceedings of 1996 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP)
684
687
Study of the synergistic effect of electrical and thermal stresses on insulation life / Mazzanti G.; Montanari G.C.; Simoni L.. - STAMPA. - 2:(1996), pp. 684-687. (Intervento presentato al convegno 1996 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP) tenutosi a San Francisco, California (U.S.A.) nel 20-23 ottobre 1996).
Mazzanti G.; Montanari G.C.; Simoni L.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/886033
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