After former studies focused on pre-qualification test load cycles, focus is here on life fraction lost by HVDC XLPE insulated cables with rated voltage up to 500 kV subject to Type Test load cycles after CIGRÉ Technical Brochure 496. This study is carried out by refining a previously developed procedure - implemented in Matlab - for reliability estimation using both an iterative solution for transient electric field calculation and Eoll’s formula. A comparison with the results obtained by applying Eoll’s formula is performed to check the accuracy of its approximation at TT voltage.

Parametric analysis of HVDC extruded cable reliability for different cable designs / G. Mazzanti, B. Diban. - ELETTRONICO. - (2020), pp. 475-478. (Intervento presentato al convegno 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2020) tenutosi a Virtual Edition nel 19-30 ottobre 2020) [10.1109/CEIDP49254.2020.9437494].

Parametric analysis of HVDC extruded cable reliability for different cable designs

G. Mazzanti
;
B. Diban
2020

Abstract

After former studies focused on pre-qualification test load cycles, focus is here on life fraction lost by HVDC XLPE insulated cables with rated voltage up to 500 kV subject to Type Test load cycles after CIGRÉ Technical Brochure 496. This study is carried out by refining a previously developed procedure - implemented in Matlab - for reliability estimation using both an iterative solution for transient electric field calculation and Eoll’s formula. A comparison with the results obtained by applying Eoll’s formula is performed to check the accuracy of its approximation at TT voltage.
2020
Proceedings of 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2020)
475
478
Parametric analysis of HVDC extruded cable reliability for different cable designs / G. Mazzanti, B. Diban. - ELETTRONICO. - (2020), pp. 475-478. (Intervento presentato al convegno 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP 2020) tenutosi a Virtual Edition nel 19-30 ottobre 2020) [10.1109/CEIDP49254.2020.9437494].
G. Mazzanti, B. Diban
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/797183
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