A brief review of the random nature of the processes involved in producing a breakdown path through an insulator suggests that breakdown may occur spontaneously, i.e. without any physical ageing/degradation, especially at high electric fields. This can be supported by considering the distribution function of the times-to-breakdown and, in particular, the shape parameter of the Weibull distribution. The work is supported by data from tests on PET and XLPE and from a preliminary computer simulation.

Identifying Electrical Ageing in Polymeric Insulation

Mazzanti, G.
;
Diban, B.
2020

Abstract

A brief review of the random nature of the processes involved in producing a breakdown path through an insulator suggests that breakdown may occur spontaneously, i.e. without any physical ageing/degradation, especially at high electric fields. This can be supported by considering the distribution function of the times-to-breakdown and, in particular, the shape parameter of the Weibull distribution. The work is supported by data from tests on PET and XLPE and from a preliminary computer simulation.
Proceedings of 2020 3rd IEEE International Conference on Dielectrics (IEEE ICD 2020)
53
56
Fothergill, J.C.; Mazzanti, G.; Diban, B.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11585/797085
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