The role of reliability prediction during the design stage of a system is worldwide recognized. Simulation tools and proper experimental approaches are usually applied to get reliability properties. In this paper, an experimental method relying on the use the dynamic stress-strength approach is presented and applied on a simple electronic device. The obtained results are presented and discussed.

M.G. Masi, L. Peretto, R.Tinarelli (2009). Dynamic Stress-Strength Approach for Reliability Prediction. s.l : s.n.

Dynamic Stress-Strength Approach for Reliability Prediction

MASI, MARIA GABRIELLA;PERETTO, LORENZO;TINARELLI, ROBERTO
2009

Abstract

The role of reliability prediction during the design stage of a system is worldwide recognized. Simulation tools and proper experimental approaches are usually applied to get reliability properties. In this paper, an experimental method relying on the use the dynamic stress-strength approach is presented and applied on a simple electronic device. The obtained results are presented and discussed.
2009
Proceedings of the 2009 IEEE I2MTC
1171
1176
M.G. Masi, L. Peretto, R.Tinarelli (2009). Dynamic Stress-Strength Approach for Reliability Prediction. s.l : s.n.
M.G. Masi; L. Peretto; R.Tinarelli
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/79156
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