It is well known that the energy levels in the atom are defined within an energy width. Any electronic transition involving two or more levels shows a natural width given by the sum of the widths of the participating levels. Moreover, any XRF line appears to have a Lorentzian-like distribution whose full width at half maximum is the natural width. Since the Lorentzian distribution has long tails on both sides, the tails may cross above neighbor absorption edges giving rise to enhancement effects of a certain complexity. In this article we discuss the self-enhancement effects on XRF K-lines in pure element samples having atomic numbers Z = 11-92. This study is performed with deterministic calculations.
Fernandez Jorge Eduardo, Scot Viviana (2009). Self-enhancement effects on XRF K-lines due to natural width. X-RAY SPECTROMETRY, 38, 175-181 [10.1002/xrs.1137].
Self-enhancement effects on XRF K-lines due to natural width.
FERNANDEZ, JORGE EDUARDO;SCOT, VIVIANA
2009
Abstract
It is well known that the energy levels in the atom are defined within an energy width. Any electronic transition involving two or more levels shows a natural width given by the sum of the widths of the participating levels. Moreover, any XRF line appears to have a Lorentzian-like distribution whose full width at half maximum is the natural width. Since the Lorentzian distribution has long tails on both sides, the tails may cross above neighbor absorption edges giving rise to enhancement effects of a certain complexity. In this article we discuss the self-enhancement effects on XRF K-lines in pure element samples having atomic numbers Z = 11-92. This study is performed with deterministic calculations.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
