Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. Here a combination of cross-sectional noncontact atomic force microscopy, x-ray photoelectron spectroscopy, and density-functional theory were used to study the distribution of Eu2+ dopants in a NaI scintillator activated by 3% EuI2. A variety of Eu-based structures were identified in crystals subjected to different postgrowth treatments. Transparent crystals with good scintillation properties contained mainly small precipitates with a cubic crystal structure and a size below 4 nm. Upon annealing, Eu segregated toward the surface, resulting in the formation of an ordered hexagonal overlayer with a EuI2 composition and a pronounced, unidirectional moiré pattern. Crystals with poor optical transparency showed a significant degree of mosaicity and the presence of precipitates. All investigated crystals contained a very low concentration of Eu dopants present as isolated point defects; most of the europium was incorporated in larger structures.

Ulreich, M., Boatner, L.A., Sokolovic, I., Reticcioli, M., Stoeger, B., Poelzleitner, F., et al. (2019). Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy. PHYSICAL REVIEW MATERIALS, 3(7), 1-7 [10.1103/PhysRevMaterials.3.075004].

Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy

Franchini C.
Membro del Collaboration Group
;
2019

Abstract

Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. Here a combination of cross-sectional noncontact atomic force microscopy, x-ray photoelectron spectroscopy, and density-functional theory were used to study the distribution of Eu2+ dopants in a NaI scintillator activated by 3% EuI2. A variety of Eu-based structures were identified in crystals subjected to different postgrowth treatments. Transparent crystals with good scintillation properties contained mainly small precipitates with a cubic crystal structure and a size below 4 nm. Upon annealing, Eu segregated toward the surface, resulting in the formation of an ordered hexagonal overlayer with a EuI2 composition and a pronounced, unidirectional moiré pattern. Crystals with poor optical transparency showed a significant degree of mosaicity and the presence of precipitates. All investigated crystals contained a very low concentration of Eu dopants present as isolated point defects; most of the europium was incorporated in larger structures.
2019
Ulreich, M., Boatner, L.A., Sokolovic, I., Reticcioli, M., Stoeger, B., Poelzleitner, F., et al. (2019). Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy. PHYSICAL REVIEW MATERIALS, 3(7), 1-7 [10.1103/PhysRevMaterials.3.075004].
Ulreich, M.; Boatner, L. A.; Sokolovic, I.; Reticcioli, M.; Stoeger, B.; Poelzleitner, F.; Franchini, C.; Schmid, M.; Diebold, U.; Setvin, M.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/727572
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