This paper overviews 18 plagiarism detectors that have been developed and evaluated within PAN'10. We start with a unified retrieval process that summarizes the best practices employed this year. Then, the detectors' performances are evaluated in detail, highlighting several important aspects of plagiarism detection, such as obfuscation, intrinsic vs. external plagiarism, and plagiarism case length. Finally, all results are compared to those of last year's competition.
Potthast M., Barron-Cedeno A., Eiselt A., Stein B., Rosso P. (2010). Overview of the 2nd international competition on plagiarism detection. CEUR-WS.
Overview of the 2nd international competition on plagiarism detection
Barron-Cedeno A.;
2010
Abstract
This paper overviews 18 plagiarism detectors that have been developed and evaluated within PAN'10. We start with a unified retrieval process that summarizes the best practices employed this year. Then, the detectors' performances are evaluated in detail, highlighting several important aspects of plagiarism detection, such as obfuscation, intrinsic vs. external plagiarism, and plagiarism case length. Finally, all results are compared to those of last year's competition.File in questo prodotto:
File | Dimensione | Formato | |
---|---|---|---|
CLEF2010wn-PAN-PotthastEt2010a.pdf
accesso aperto
Tipo:
Versione (PDF) editoriale
Licenza:
Licenza per Accesso Aperto. Creative Commons Attribuzione (CCBY)
Dimensione
169.06 kB
Formato
Adobe PDF
|
169.06 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.