With the purpose of understanding more and more the causes of fault for MV cable-joints this paper deals the interfacial pressure vs. temperature issue. By starting from results obtained by the authors in the field of cable- joints, firstly a test bed for pressure measurements is developed and characterized. Afterwards temperature test cycles have been defined to measure how temperature affects the interfacial pressure (XLPE/Silicon rubber) inside the cable-joints. Presented results confirm the accuracy of the developed setup and the pressure vs. temperature behaviour of two different cable-joints.

Test Bed Characterization for the Interfacial Pressure vs. Temperature Measurements in MV Cable-Joints / Di Sante, Raffaella; Ghaderi, Abbas; Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto. - ELETTRONICO. - (2019), pp. 186-190. (Intervento presentato al convegno 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) tenutosi a Napoli (Italia) nel 4-6 giugno 2019) [10.1109/METROI4.2019.8792867].

Test Bed Characterization for the Interfacial Pressure vs. Temperature Measurements in MV Cable-Joints

Di Sante, Raffaella;Ghaderi, Abbas;Mingotti, Alessandro;Peretto, Lorenzo;Tinarelli, Roberto
2019

Abstract

With the purpose of understanding more and more the causes of fault for MV cable-joints this paper deals the interfacial pressure vs. temperature issue. By starting from results obtained by the authors in the field of cable- joints, firstly a test bed for pressure measurements is developed and characterized. Afterwards temperature test cycles have been defined to measure how temperature affects the interfacial pressure (XLPE/Silicon rubber) inside the cable-joints. Presented results confirm the accuracy of the developed setup and the pressure vs. temperature behaviour of two different cable-joints.
2019
Proc. of 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT)
186
190
Test Bed Characterization for the Interfacial Pressure vs. Temperature Measurements in MV Cable-Joints / Di Sante, Raffaella; Ghaderi, Abbas; Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto. - ELETTRONICO. - (2019), pp. 186-190. (Intervento presentato al convegno 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) tenutosi a Napoli (Italia) nel 4-6 giugno 2019) [10.1109/METROI4.2019.8792867].
Di Sante, Raffaella; Ghaderi, Abbas; Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/697931
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