The combined use of the X-ray Absorption Spectroscopy (XAS) and Powder X-Ray diffraction (PXRD) techniques in operando mode at both MCX and XAFS beamlines of ELETTRA will be complemented by ex situ TEM studies at the National Institute of Material Physics in Bucharest. The XAFS and PXRD study will be performed in operando mode and will permit to monitor both structural and electronic modification during a full galvanostatic cycle. The electron microscopy will provide a suitable microstructural and morphological characterization of selected samples.

The combined use of the X-ray Absorption Spectroscopy (XAS) and Powder X-Ray diffraction (PXRD) techniques in operando mode at both MCX and XAFS beamlines of ELETTRA will be complemented by ex situ TEM studies at the National Institute of Material Physics in Bucharest. The XAFS and PXRD study will be performed in operando mode and will permit to monitor both structural and electronic modification during a full galvanostatic cycle. The electron microscopy will provide a suitable microstructural and morphological characterization of selected samples.

Giorgetti M
;
Mullaliu Angelo;
2018

Abstract

The combined use of the X-ray Absorption Spectroscopy (XAS) and Powder X-Ray diffraction (PXRD) techniques in operando mode at both MCX and XAFS beamlines of ELETTRA will be complemented by ex situ TEM studies at the National Institute of Material Physics in Bucharest. The XAFS and PXRD study will be performed in operando mode and will permit to monitor both structural and electronic modification during a full galvanostatic cycle. The electron microscopy will provide a suitable microstructural and morphological characterization of selected samples.
Giorgetti M; Mullaliu Angelo; Giuliana Aquilanti
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11585/666597
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