Classical bi-parental F2 mapping progenies do not allow the mapping of multiple alleles and the study of their interactions. DISTA and Società Produttori Sementi have assembled a recombinant inbred mapping population developed from a balanced four-way cross using four cultivars (Neodur, Claudio, Colosseo and Rascon) characterized by different yield and quality parameters and by resistance to powdery mildew, leaf rust and Fusarium head blight. A genetic map was generated based on AFLP and chromosome-specific SSR markers using individuals from a single segregating four-way F1 population. Assembly of the genetic map was performed using a pedigree-based multi-locus mapping software (CRI-MAP). The genetic map will be integrated with SNP markers, newly discovered using the CRoPS™ marker technology recently developed by Keygene N.V. The integrated map will then be used on inbred lines to identify QTLs of important quality and resistance traits in durum wheat. This multi-parental approach will allow for a more efficient analysis of the effect of multiple alleles and their epistatic interactions at single QTLs of complex traits such as yield, quality and response to wheat fungal diseases.
TREBBI D., MACCAFERRI M., GIULIANI S., SØRENsen A., SANGUINETI M.C., MASSI A., et al. (2008). Development of a multi-parental (four-way cross) mapping population for multi-allelic QTL analysis in durum wheat. SYDNEY : Sydney University Press.
Development of a multi-parental (four-way cross) mapping population for multi-allelic QTL analysis in durum wheat
MACCAFERRI, MARCO;GIULIANI, SILVIA;SANGUINETI, MARIA CORINNA;TUBEROSA, ROBERTO
2008
Abstract
Classical bi-parental F2 mapping progenies do not allow the mapping of multiple alleles and the study of their interactions. DISTA and Società Produttori Sementi have assembled a recombinant inbred mapping population developed from a balanced four-way cross using four cultivars (Neodur, Claudio, Colosseo and Rascon) characterized by different yield and quality parameters and by resistance to powdery mildew, leaf rust and Fusarium head blight. A genetic map was generated based on AFLP and chromosome-specific SSR markers using individuals from a single segregating four-way F1 population. Assembly of the genetic map was performed using a pedigree-based multi-locus mapping software (CRI-MAP). The genetic map will be integrated with SNP markers, newly discovered using the CRoPS™ marker technology recently developed by Keygene N.V. The integrated map will then be used on inbred lines to identify QTLs of important quality and resistance traits in durum wheat. This multi-parental approach will allow for a more efficient analysis of the effect of multiple alleles and their epistatic interactions at single QTLs of complex traits such as yield, quality and response to wheat fungal diseases.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
