The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert – Zernike theorem.

Retrieving of the complex degree of spatial coherence of electron beams / J. Carrasquilla-Alvarez; R. Castaneda; J. Garcia-Sucerquia; M. Schofield; M. Beleggia; Y. Zhu; G. Matteucci. - In: OPTIK. - ISSN 0030-4026. - ELETTRONICO. - 119:(2008), pp. 127-133. [10.1016/j.ijleo.2006.07.007]

Retrieving of the complex degree of spatial coherence of electron beams

MATTEUCCI, GIORGIO
2008

Abstract

The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert – Zernike theorem.
2008
Retrieving of the complex degree of spatial coherence of electron beams / J. Carrasquilla-Alvarez; R. Castaneda; J. Garcia-Sucerquia; M. Schofield; M. Beleggia; Y. Zhu; G. Matteucci. - In: OPTIK. - ISSN 0030-4026. - ELETTRONICO. - 119:(2008), pp. 127-133. [10.1016/j.ijleo.2006.07.007]
J. Carrasquilla-Alvarez; R. Castaneda; J. Garcia-Sucerquia; M. Schofield; M. Beleggia; Y. Zhu; G. Matteucci
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/64869
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