This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.

Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform

Alberto Maria Angelotti
;
Gian Piero Gibiino
;
Alberto Santarelli
2018

Abstract

This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.
IEEE MTT-S International Microwave Symposium Digest
1021
1024
Alberto Maria Angelotti, Gian Piero Gibiino, Troels Nielsen, Felice Francesco Tafuri, Alberto Santarelli
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/647723
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