The paper addresses one of the new and most important issues arising when Low Power Voltage Transformers (LPVT) are used in power network substations for evaluating, among others, also the residual voltage. Conversely to open-triangle inductive instrument transformers, the use of phase voltage transformers for measuring the residual voltage gets challenging due to the very high accuracy required for the three LPVTs. In the paper, an analytical study will be presented along with simulation results in order to show the relationship between the accuracy class and the uncertainty affecting the residual voltage value.

Low power voltage transformer accuracy class effects on the residual voltage measurement / Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto. - ELETTRONICO. - (2018), pp. 1-6. (Intervento presentato al convegno 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 tenutosi a Houston, TX, USA nel 14-17 May 2018) [10.1109/I2MTC.2018.8409807].

Low power voltage transformer accuracy class effects on the residual voltage measurement

MINGOTTI, ALESSANDRO;Peretto, Lorenzo;Tinarelli, Roberto
2018

Abstract

The paper addresses one of the new and most important issues arising when Low Power Voltage Transformers (LPVT) are used in power network substations for evaluating, among others, also the residual voltage. Conversely to open-triangle inductive instrument transformers, the use of phase voltage transformers for measuring the residual voltage gets challenging due to the very high accuracy required for the three LPVTs. In the paper, an analytical study will be presented along with simulation results in order to show the relationship between the accuracy class and the uncertainty affecting the residual voltage value.
2018
I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings
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Low power voltage transformer accuracy class effects on the residual voltage measurement / Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto. - ELETTRONICO. - (2018), pp. 1-6. (Intervento presentato al convegno 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 tenutosi a Houston, TX, USA nel 14-17 May 2018) [10.1109/I2MTC.2018.8409807].
Mingotti, Alessandro; Peretto, Lorenzo; Tinarelli, Roberto
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/641960
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