Quantitative measurements of changes in skin topographic structures are of a great importance in the dermocosmetic field to assess subjects response to medical or cosmetic treatments. Recently, non invasive skin evaluations are possible in vivo thanks to new technologies. However, some concerns about high system cost are limiting, de facto, a widespread use of these devices for a routine based approach. In this work, a new low-cost skin surface characterization system based on the analysis of capacitive images has been evaluated. Comparative analysis between capacitive skin samples and replica based casts of skin tissue have been achieved through optical profilometry to better understand the potentiality and limitations of the proposed system.
A. Bevilacqua, A. Gherardi (2008). Characterization of a capacitive imaging system for skin surface analysis. s.l : D.S.masmoudi, K. Djemal.
Characterization of a capacitive imaging system for skin surface analysis
BEVILACQUA, ALESSANDRO;GHERARDI, ALESSANDRO
2008
Abstract
Quantitative measurements of changes in skin topographic structures are of a great importance in the dermocosmetic field to assess subjects response to medical or cosmetic treatments. Recently, non invasive skin evaluations are possible in vivo thanks to new technologies. However, some concerns about high system cost are limiting, de facto, a widespread use of these devices for a routine based approach. In this work, a new low-cost skin surface characterization system based on the analysis of capacitive images has been evaluated. Comparative analysis between capacitive skin samples and replica based casts of skin tissue have been achieved through optical profilometry to better understand the potentiality and limitations of the proposed system.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.