Thin33S samples for the study of the33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Preparation and characterization of33S samples for33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN
Massimi, C.;Mingrone, F.;Vannini, G.;
2018
Abstract
Thin33S samples for the study of the33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.