We present a study focussed at the atomic level characterization of the Fe/MgO(001) interface by means of X-ray photoelectron spectroscopy, X-ray photoelectron diffraction and X-ray absorption spectroscopy. The data show a good crystalline quality of the Fe films grown on MgO(001) at room temperature. The films have a bcc structure with the Fe(001)//MgO(001) and Fe[110]//MgO[100] orientation. The Fe growth in the 1–10 ML thickness range proceeds by the formation of islands covering a fraction of the MgO surface. The oxidation of Fe and the consequent reduction of MgO can be excluded, thus proving that the interface is locally abrupt, with a very weak interaction between the two sides. The interface is stable with temperature up to 670 K.
P. Luches, S. Benedetti, M. Liberati, F. Boscherini, I.I. Pronin, S. Valeri (2005). Absence of oxide formation at the Fe/MgO interface. SURFACE SCIENCE, 583, 191-198 [10.1016/j.susc.2005.03.038].
Absence of oxide formation at the Fe/MgO interface
BOSCHERINI, FEDERICO;
2005
Abstract
We present a study focussed at the atomic level characterization of the Fe/MgO(001) interface by means of X-ray photoelectron spectroscopy, X-ray photoelectron diffraction and X-ray absorption spectroscopy. The data show a good crystalline quality of the Fe films grown on MgO(001) at room temperature. The films have a bcc structure with the Fe(001)//MgO(001) and Fe[110]//MgO[100] orientation. The Fe growth in the 1–10 ML thickness range proceeds by the formation of islands covering a fraction of the MgO surface. The oxidation of Fe and the consequent reduction of MgO can be excluded, thus proving that the interface is locally abrupt, with a very weak interaction between the two sides. The interface is stable with temperature up to 670 K.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
