We present a study focussed at the atomic level characterization of the Fe/MgO(001) interface by means of X-ray photoelectron spectroscopy, X-ray photoelectron diffraction and X-ray absorption spectroscopy. The data show a good crystalline quality of the Fe films grown on MgO(001) at room temperature. The films have a bcc structure with the Fe(001)//MgO(001) and Fe[110]//MgO[100] orientation. The Fe growth in the 1–10 ML thickness range proceeds by the formation of islands covering a fraction of the MgO surface. The oxidation of Fe and the consequent reduction of MgO can be excluded, thus proving that the interface is locally abrupt, with a very weak interaction between the two sides. The interface is stable with temperature up to 670 K.
Absence of oxide formation at the Fe/MgO interface
BOSCHERINI, FEDERICO;
2005
Abstract
We present a study focussed at the atomic level characterization of the Fe/MgO(001) interface by means of X-ray photoelectron spectroscopy, X-ray photoelectron diffraction and X-ray absorption spectroscopy. The data show a good crystalline quality of the Fe films grown on MgO(001) at room temperature. The films have a bcc structure with the Fe(001)//MgO(001) and Fe[110]//MgO[100] orientation. The Fe growth in the 1–10 ML thickness range proceeds by the formation of islands covering a fraction of the MgO surface. The oxidation of Fe and the consequent reduction of MgO can be excluded, thus proving that the interface is locally abrupt, with a very weak interaction between the two sides. The interface is stable with temperature up to 670 K.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
