Surface photovoltage spectroscopy (SPS) and conductive atomic force microscopy (C-AFM) have been used for the characterization of nanocrystalline hydrogenated Si (nc-Si:H). This is a promising material both for silicon-based optoelectronics as well as for photovoltaic applications. Notwithstanding its interesting properties many issues regarding the material electronic and optical properties are not completely understood. The present contribution reports microscopic and spectroscopic analyses of nc-Si:H films grown for photovoltaic applications by low-energy plasmaenhanced chemical vapor deposition technique. Electronic levels associated with defect states were investigated by SPS, whereas the conduction mechanism at a microscopic level was investigated by C-AFM.

A. Cavallini, D. Cavalcoli (2008). Nanostructures in Silicon Investigated by Atomic Force Microscopy and Surface Photovoltage Spectroscopy. SCANNING, 30 Issue: 4, 358-363 [10.1002/sca.20110].

Nanostructures in Silicon Investigated by Atomic Force Microscopy and Surface Photovoltage Spectroscopy

CAVALLINI, ANNA
Writing – Review & Editing
;
CAVALCOLI, DANIELA
Writing – Original Draft Preparation
2008

Abstract

Surface photovoltage spectroscopy (SPS) and conductive atomic force microscopy (C-AFM) have been used for the characterization of nanocrystalline hydrogenated Si (nc-Si:H). This is a promising material both for silicon-based optoelectronics as well as for photovoltaic applications. Notwithstanding its interesting properties many issues regarding the material electronic and optical properties are not completely understood. The present contribution reports microscopic and spectroscopic analyses of nc-Si:H films grown for photovoltaic applications by low-energy plasmaenhanced chemical vapor deposition technique. Electronic levels associated with defect states were investigated by SPS, whereas the conduction mechanism at a microscopic level was investigated by C-AFM.
2008
A. Cavallini, D. Cavalcoli (2008). Nanostructures in Silicon Investigated by Atomic Force Microscopy and Surface Photovoltage Spectroscopy. SCANNING, 30 Issue: 4, 358-363 [10.1002/sca.20110].
A. Cavallini; D. Cavalcoli
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/61769
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