Scanning probe-atomic force microscopy: New developments and applications

Recent developments in scanning probe microscopy (SPM) have widened the spectrum of possible investigations that can be performed at a nanometric level at the surfaces of materials. They range, for instance, from physical properties such as surface potential and electric field topological determination to chemical, nanomechanical, catalytic and spectroscopic analysis in air in liquid or in a gaseous environment. After a brief introduction to new SPM technological developments, we present recent achievements in the characterisation and application of nanomorphology, electrostatic surface potential, dielectric properties, shear force microscopy and radiofrequency measurements, scanning microwave microscopy, nanomechanical properties mapping, frequency modulation SPM in air, liquid, vacuum, and finally high-speed SPM.