The Top Sharpening Index (TSI) is a measure proposed to simply evaluate fingerprint image focusing. In fact, though precise guidelines have been given by NIST and FBI for the evaluation of fingerprint scanners for AFIS applications, no simple and practical techniques have yet been proposed for non-AFIS environments. TSI is based on the measurement of the steepness of the ridge/valley transitions of the fingerprint impressions. In this work a deep analysis of TSI is carried out and its relation to two well known quality indicators (MTF e IQM) is investigated to highlight analogies and differences.
M. Ferrara, A. Franco, D. Maltoni (2007). Fingerprint scanner focusing estimation by Top Sharpening Index. PISCATAWAY : IEEE [10.1109/ICIAP.2007.4362783].
Fingerprint scanner focusing estimation by Top Sharpening Index
FERRARA, MATTEO;FRANCO, ANNALISA;MALTONI, DAVIDE
2007
Abstract
The Top Sharpening Index (TSI) is a measure proposed to simply evaluate fingerprint image focusing. In fact, though precise guidelines have been given by NIST and FBI for the evaluation of fingerprint scanners for AFIS applications, no simple and practical techniques have yet been proposed for non-AFIS environments. TSI is based on the measurement of the steepness of the ridge/valley transitions of the fingerprint impressions. In this work a deep analysis of TSI is carried out and its relation to two well known quality indicators (MTF e IQM) is investigated to highlight analogies and differences.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.