The paper describes an innovative idea for an ionizing particle detector. The principle is based on a latchup effect that is common in to-date CMOS technologies working in a radiation environment. In principle the detector can operate at room temperature, does not require a high voltage power supply and is intrinsically more tolerant to radiation effects than the common solid-state detectors. A latchup-based detector can be constructed using state-of-the-art technologies and could be applied for beam monitoring or as a heavy-ion selector. A prototype made up of discrete components is described and its rough sensitivity is exploited. Tests with daylight, electrons, via a current pulse generator and with a laser beam have proved that charge sensitivity of the order of 1 pC can be easily achieved

Particle detector prototype based on a discrete-cell sensitive to latchup effect / A. Gabrielli. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 17:(2006), pp. 2269-2274. [10.1088/0957-0233/17/8/030]

Particle detector prototype based on a discrete-cell sensitive to latchup effect

GABRIELLI, ALESSANDRO
2006

Abstract

The paper describes an innovative idea for an ionizing particle detector. The principle is based on a latchup effect that is common in to-date CMOS technologies working in a radiation environment. In principle the detector can operate at room temperature, does not require a high voltage power supply and is intrinsically more tolerant to radiation effects than the common solid-state detectors. A latchup-based detector can be constructed using state-of-the-art technologies and could be applied for beam monitoring or as a heavy-ion selector. A prototype made up of discrete components is described and its rough sensitivity is exploited. Tests with daylight, electrons, via a current pulse generator and with a laser beam have proved that charge sensitivity of the order of 1 pC can be easily achieved
2006
Particle detector prototype based on a discrete-cell sensitive to latchup effect / A. Gabrielli. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 17:(2006), pp. 2269-2274. [10.1088/0957-0233/17/8/030]
A. Gabrielli
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/44930
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