12th IEEE International On-Line Testing Symposium

Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. The Symposium is sponsored by the IEEE Computer Society and Test Technology Technical Council (TTTC). General Chairs: Cecilia Metra (University of Bologna) Michael Nicolaidis (TIMA Laboratory) Program Chairs: Regis Leveugle (TIMA Laboratory) Rob Aitken (ARM, USA)